Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2005-09-16
2011-12-13
Britt, Cynthia (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S038100, C702S081000, C702S182000, C717S100000, C717S102000, C717S124000, C717S125000, C717S168000
Reexamination Certificate
active
08078924
ABSTRACT:
The present invention is directed to a system and method for a quality assurance tool generating test plans and identifying new test requirements for a new version of a product. Old versions of the product may be previously tested and test plan documents associated with previously tested versions of the product may be stored in a database. The database may store test plans, test configurations, test scopes, and the like for previously tested versions of the product. Product design requirements may be determined based on received customer desired features for the new version. The database may be updated by adding new tests for new features of the new version. A test plan document for the product may be generated based on the updated database. The generated test document may be verified through automatically generating a general test plan for the new version of the product by querying updated database with the product design requirements.
REFERENCES:
patent: 5633813 (1997-05-01), Srinivasan
patent: 6442714 (2002-08-01), Griffin et al.
patent: 6647513 (2003-11-01), Hekmatpour
patent: 6732296 (2004-05-01), Cherny et al.
patent: 6742166 (2004-05-01), Foster et al.
patent: 6783904 (2004-08-01), Strozewski et al.
patent: 6973417 (2005-12-01), Maxwell et al.
patent: 6978210 (2005-12-01), Suter et al.
patent: 7007251 (2006-02-01), Hekmatpour
patent: 7370043 (2008-05-01), Shelton et al.
patent: 2002/0048212 (2002-04-01), Hill et al.
patent: 2002/0138510 (2002-09-01), Tan
patent: 2003/0018945 (2003-01-01), Foster et al.
patent: 2003/0212924 (2003-11-01), Avvari et al.
patent: 2003/0213613 (2003-11-01), Strozewski et al.
patent: 2004/0078684 (2004-04-01), Friedman et al.
patent: 2004/0107415 (2004-06-01), Melamed et al.
patent: 2005/0080502 (2005-04-01), Chernyak et al.
patent: 2005/0204201 (2005-09-01), Meenakshisundaram et al.
patent: 2006/0064178 (2006-03-01), Butterfield et al.
patent: 2006/0069958 (2006-03-01), Sawicki et al.
patent: 2006/0107141 (2006-05-01), Hekmatpour
Morgan L. Swink and Roger Calantone, Design-Manufacturing Integration as a Mediator of Antecedents to New Product Design Quality, Nov. 2004, IEEE, vol. 51, No. 4.
Cathy A. Rusinko, Exploring the Use of Design-Manufacturing Integration (DMI) to Facilitate Product Development: A Test of Some Practices, Feb. 1999, IEEE, vol. 46, No. 1.
Gupta, S.C.; Sinha, M.K.; Impact of software testability considerations on software development life cycle, 1994.
Evbuomwan, N.F.O. ; Sivaloganathan, S. ; Jebb, A. ; Design function deployment—a design for quality system, May 6, 1994, Customer Driven Quality in Product Design, IEE Colloquium, pp. 7/1-7/3.
Britt Cynthia
LSI Corporation
Merant Guerrier
Suiter Swantz pc llo
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