Bit line sense amplifier of semiconductor memory device...

Static information storage and retrieval – Read/write circuit – Flip-flop used for sensing

Reexamination Certificate

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Details

C365S063000, C365S072000, C365S202000, C365S203000, C365S207000

Reexamination Certificate

active

08050125

ABSTRACT:
In an embodiment, a bit line sense amplifier of a semiconductor memory device with an open bit line structure includes sense amplifier blocks, first voltage drivers, and a second voltage driver. The sense amplifier blocks include a first sense amplifier and a second sense amplifier, each sensing and amplifying a signal difference between a bit line and a complementary bit line. The first voltage drivers apply a power source voltage to the first sense amplifier, and the second voltage driver applies a ground voltage to the second sense amplifier. The first voltage drivers are disposed for every two or more sense amplifier blocks in a bit line sense amplifier region in which the sense amplifier blocks are arranged, and the second voltage driver is disposed in a conjunction region in which a control circuit is located to control the sense amplifier blocks. Both capacitive noise and device size are minimized.

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patent: 5973983 (1999-10-01), Hidaka
patent: 6088275 (2000-07-01), Tanaka
patent: 6661714 (2003-12-01), Lee
patent: 6735134 (2004-05-01), Park
patent: 6765833 (2004-07-01), Khang
patent: 7499307 (2009-03-01), Leung
patent: 7505297 (2009-03-01), Im et al.
patent: 2007/0206402 (2007-09-01), Liaw et al.
patent: 2000-208739 (2000-07-01), None
patent: 2001-244438 (2001-09-01), None
patent: 2003-08-22 (2003-08-01), None

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