Substrate processing method and substrate processing apparatus

Etching a substrate: processes – Gas phase etching of substrate – Application of energy to the gaseous etchant or to the...

Reexamination Certificate

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C216S058000, C216S067000, C438S714000, C156S345330

Reexamination Certificate

active

08066894

ABSTRACT:
A substrate can be appropriately oxidized, while oxidation of the substrate can be suppressed.The present invention includes a step of generating mixed plasma by causing a mixed gas of hydrogen (H2) gas and oxygen (O2) or oxygen-containing gas supplied to a processing chamber to form a plasma discharge, and processing the starting substrate by the mixed plasma; and a step of generating hydrogen plasma by causing hydrogen (H2) gas supplied to the processing chamber to form a plasma discharge, and processing the substrate by the hydrogen plasma.

REFERENCES:
patent: 6635185 (2003-10-01), Demmin et al.
patent: 6834656 (2004-12-01), Qingyuan et al.
patent: 2002/0197402 (2002-12-01), Chiang et al.
patent: 2004/0245584 (2004-12-01), Murakawa et al.
patent: A 8-102534 (1996-04-01), None
patent: A 2000-150479 (2000-05-01), None
patent: A 2000-332245 (2000-11-01), None
patent: A-2003-68731 (2003-03-01), None
patent: A 2003-163213 (2003-06-01), None
patent: WO 2004/073073 (2004-08-01), None
English-language translation of Japanese Office Action issued in Japanese Patent Application 2007-508141 drafted on May 25, 2010.

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