Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257SE29255, C438S682000

Reexamination Certificate

active

08058695

ABSTRACT:
A semiconductor device includes a silicon substrate, and a NiSi layer provided on the silicon substrate aiming to suppress oxidation of the surface of a NiSi layer and the resistivity increase. The NiSi layer includes a bottom NiSi region and a top NiSi region. The bottom NiSi region provided in contact with silicon surface, and containing substantially no nitrogen. The top NiSi region is a nitrided NiSi region provided in contact with the bottom NiSi region, and containing nitrogen. The NiSi layer has a total thickness of 50 nm or below.

REFERENCES:
patent: 5840626 (1998-11-01), Ohguro
patent: 6008124 (1999-12-01), Sekiguchi et al.
patent: 2002/0068444 (2002-06-01), Bertrand et al.
patent: 07-038104 (1995-02-01), None
patent: 9-153616 (1997-06-01), None
patent: 2004-128501 (2004-04-01), None
patent: 2004-172571 (2004-06-01), None
patent: 2004-319592 (2004-11-01), None
patent: 2005-522035 (2005-07-01), None

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