4. Optics: measuring and testing
  5. For optical fiber or waveguide inspection

Takashi Ide

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Apparatus and method for measuring crystal lattice strain

Optics: measuring and testing – Crystal or gem examination
Patent

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Apparatus for measuring the cut-off wavelength of a single-mode

Optics: measuring and testing – For optical fiber or waveguide inspection
Patent

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Image forming apparatus

Electrophotography – Machine operation – Operator interface
Reexamination Certificate

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Image forming apparatus

Electrophotography – Machine operation – Operator interface
Reexamination Certificate

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Image forming apparatus

Data processing: generic control systems or specific application – Specific application – apparatus or process – Article handling
Reexamination Certificate

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Profile ID: LFUS-PAI-P-672345

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