Semiconductor apparatus and method of disposing observation...

Details Semiconductor apparatus and method of disposing observation... Semiconductor apparatus and method of disposing observation...

2007-05-04

2011-10-18

Gaffin, Jeffrey A (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S726000, C714S738000, C714S729000, C702S117000, C702S118000, C702S121000, C716S136000

Reexamination Certificate

active

08042014

ABSTRACT:
A semiconductor apparatus includes a functional block to observe a state of a signal line in the apparatus. The functional block includes a signal transfer section to receive, transmit and output the state of the signal line, and an observation flip-flop to store a state of an input terminal or an output terminal of the signal transfer section.

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Japanese Patent Application No. 2006-131977 Office Action dated Nov. 24, 2010, with partial English translation.

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