Nonvolatile memory devices having bit line discharge control...

Static information storage and retrieval – Systems using particular element – Amorphous

Reexamination Certificate

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C365S148000

Reexamination Certificate

active

08040719

ABSTRACT:
A memory device includes a memory array having a plurality of rows and columns of nonvolatile memory cells (e.g., PRAM cells) therein and a first plurality of local bit lines electrically coupled to a corresponding first plurality of columns of memory cells in the memory array. A first plurality of bit line selection circuits are also provided, which are responsive to bit line selection signals. A first plurality of bit line discharge circuits are electrically connected to respective ones of the first plurality of local bit lines. A bit line discharge control circuit is provided to drive the first plurality of bit line discharge circuits with equivalent bit line discharge signals during an operation to read data from a selected one of the first plurality of local bit lines.

REFERENCES:
patent: 6480438 (2002-11-01), Park
patent: 6487113 (2002-11-01), Park et al.
patent: 6791867 (2004-09-01), Tran
patent: 7215592 (2007-05-01), Cho et al.
patent: 7227776 (2007-06-01), Cho et al.
patent: 7242605 (2007-07-01), Choi et al.
patent: 7391669 (2008-06-01), Kim et al.
patent: 7397681 (2008-07-01), Cho et al.
patent: 2003/0043620 (2003-03-01), Ooishi
patent: 2004/0081004 (2004-04-01), Okazawa
patent: 2004/0246808 (2004-12-01), Cho et al.
patent: 2005/0030814 (2005-02-01), Oh et al.
patent: 2005/0270883 (2005-12-01), Cho et al.
Cho et al., “A 0.18 μm 3.0V 64Mb Non-Volatile Phase-Transition Random-Access Memory (PRAM),” Paper 2.1, ISSCC 2004, Session 2, 2004 IEEE International Solid-State Circuits Conference, Feb. 16, 2004, pp. 1-2.

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