Dual controllers for scan paths, distributors, and collectors

Details Dual controllers for scan paths, distributors, and collectors Dual controllers for scan paths, distributors, and collectors

2010-11-30

2011-11-22

Gaffin, Jeffrey A (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S731000, C714S726000

Reexamination Certificate

active

08065577

ABSTRACT:
Functional circuits and cores of circuits are tested on integrated circuits using scan paths. Using parallel scan distributor and collector circuits for these scan paths improves test access of circuits and cores embedded within ICs and reduces the IC's power consumption during scan testing. A controller for the distributor and collector circuits includes a test control register, a test control state machine and a multiplexer. These test circuits can be connected in a hierarchy or in parallel. A conventional test access port or TAP can be modified to work with the disclosed test circuits.

Affiliated with

Also associated with

Rating

Dual controllers for scan paths, distributors, and collectors does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Dual controllers for scan paths, distributors, and collectors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dual controllers for scan paths, distributors, and collectors will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4258578