Semiconductor device and manufacturing method thereof

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C438S135000, C438S136000, C438S137000, C438S197000, C257S296000, C257S297000, C257S298000, C257S299000

Reexamination Certificate

active

08067289

ABSTRACT:
A semiconductor device and a method of manufacturing a semiconductor device. A semiconductor device may include an epitaxial layer over a semiconductor substrate, a first well region over a epitaxial layer, a first isolation layer and/or a third isolation layer at opposite sides of said first well region and/or a second isolation layer over a first well region between first and third isolation layers. A semiconductor device may include a gate over a second isolation layer. A semiconductor device may include a second well region over a first well region between a third isolation layer and a gate, a first ion-implanted region over a second well region between a third isolation layer and a gate, and/or a second ion-implanted region between a first ion-implanted region and a gate. A semiconductor device may include an accumulation channel between a second well region and a gate.

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