Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-09-25
2010-06-08
Jackson, Jr., Jerome (Department: 2815)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C257SE21422, C257SE21626
Reexamination Certificate
active
07732277
ABSTRACT:
A semiconductor device according to an embodiment of the present invention includes: a semiconductor substrate; an isolation structure formed in a trench, formed in the semiconductor substrate, through a semiconductor oxide film; a floating gate formed on the semiconductor substrate between the isolation structures through an insulating film; a gate oxidation protection film formed on a side surface, on the isolation structure side, of the floating gate so that each of a part of a side surface and a bottom surface of the gate oxidation protection film contacts the insulating film; and a control gate formed on the floating gate through an inter-gate insulating film.
REFERENCES:
patent: 7060559 (2006-06-01), Ozawa et al.
patent: 7259421 (2007-08-01), Hur et al.
patent: 2002/0117706 (2002-08-01), Shimizu
patent: 2004/0099900 (2004-05-01), Iguchi et al.
patent: 2004/0159886 (2004-08-01), Lee et al.
patent: 2005/0245029 (2005-11-01), Choi et al.
patent: 2001-144170 (2001-05-01), None
patent: 2004-186185 (2004-07-01), None
Akahori Hiroshi
Aoki Nobutoshi
Budd Paul A
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Jackson, Jr. Jerome
Kabushiki Kaisha Toshiba
LandOfFree
Semiconductor device and method of fabricating the same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device and method of fabricating the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and method of fabricating the same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4199932