Static information storage and retrieval – Systems using particular element – Resistive
Reexamination Certificate
2006-08-22
2010-02-23
Pert, Evan (Department: 2826)
Static information storage and retrieval
Systems using particular element
Resistive
C365S163000, C257S002000, C257SE21536, C257SE29143, C438S382000
Reexamination Certificate
active
07667998
ABSTRACT:
A PRAM and method of forming the same are disclosed. In various embodiments, the PRAM includes a lower insulation layer formed on a semiconductor substrate, a phase change material pattern formed on the lower insulation layer and a heating electrode contacting the phase change material pattern. The heating electrode can be formed of a material having a positive temperature coefficient such that specific resistance of the material increases as a function of temperature.
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Cuong et al., “Characterizations of high resistivity TiNxOy thin films for applications in thin film resistors,” (Mar. 2007) Microelectronics Reliability No. 47, pp. 752-754.
Jeong Chang-Wook
Jeong Won-Cheol
Lee Se-Ho
Park Jae-Hyun
Pert Evan
Samsung Electronics Co,. Ltd.
Volentine & Whitt PLLC
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