Image sensor with light receiving region having different...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S292000, C257S440000

Reexamination Certificate

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07812381

ABSTRACT:
There is provided a CMOS image sensor and an electronic product using the same. The CMOS image sensor includes a plurality of pixels for embodying colors having different wavelengths. Each of pixels includes a buried barrier layer disposed in a semiconductor substrate and having a barrier potential energy of a conduction band thereof at an equilibrium state, a first layer disposed at a main surface of the semiconductor substrate separated from the buried barrier layer in a vertical direction and having a first potential energy of a conduction band thereof at the equilibrium state, and a second layer disposed between the first region and the buried barrier layer having a second potential energy of a conduction band thereof at the equilibrium state. The second potential energy is higher than the first potential energy and the barrier potential energy and a thickness of the second layer is thicker as the wavelength is longer.

REFERENCES:
patent: 6756616 (2004-06-01), Rhodes
patent: 7423305 (2008-09-01), Shinohara et al.
patent: 7531857 (2009-05-01), Park
patent: 2004/0080638 (2004-04-01), Lee
patent: 2006/0163618 (2006-07-01), Park
patent: 2004-146764 (2004-05-01), None
patent: 10-0390823 (2003-06-01), None
patent: 10-2004-0036087 (2004-04-01), None
“Image Sensor with Buried Barrier Layer Having Different Thickness According to Wavelength of Light and Method of Forming the Same”, Specification, Drawings, and Prosecution History, of U.S. Appl. No. 11/335,405, filed Jan. 19, 2006 (Patent No. 7,531,857, scheduled to issue May 12, 2009), by Young-Hoon Park, which is stored in the United States Patent and Trademark Office (USPTO) Image File Wrapper (IFW) system.

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