Semiconductor integrated circuit device and test terminal...

Details Semiconductor integrated circuit device and test terminal... Semiconductor integrated circuit device and test terminal...

2009-09-08

2010-11-30

Le, Don P (Department: 2819)

Electronic digital logic circuitry

Significant integrated structure, layout, or layout...

C326S016000

Reexamination Certificate

active

07843226

ABSTRACT:
A semiconductor integrated circuit device includes a column of first logic circuit cells arranged along a first side of a chip and a column of second logic circuit cells arranged along a second side orthogonal to the first side. At a corner part where the first side crosses the second side, a first test logic circuit cell is arranged to have its long side faced with a side of a cell at an end portion of the column of the first logic circuit cells and a second logic circuit cell is arranged to have its long side faced with a side of a cell at an end portion of the column of the second logic circuit cells. The first and the second test logic circuit cells are arranged so a that planar shapes thereof are symmetrical (mirror symmetrical) to each other with respect to a virtual line intermediate between the oblique sides arranged opposite to each other.

REFERENCES:
patent: 6426645 (2002-07-01), Seki
patent: 7263679 (2007-08-01), Kuge et al.
patent: 2004/0172605 (2004-09-01), Kuge et al.
patent: 2007/0170587 (2007-07-01), Honda
patent: 4-93047 (1992-03-01), None
patent: 2000-260880 (2000-09-01), None
patent: 2004-260093 (2004-09-01), None

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