Generating test coverage bin based on simulation result

Details Generating test coverage bin based on simulation result Generating test coverage bin based on simulation result

2008-02-19

2010-11-09

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S026000, C714S724000, C714S739000, C714S723000, C714S728000, C714S718000, C714S720000, C714S037000, C714S033000, C716S030000, C716S030000

Reexamination Certificate

active

07831879

ABSTRACT:
A solution for generating functional coverage bins for testing a device is disclosed. A method includes: receiving information of a failing test generated from a random simulation performed on the device; tracing a first sequence of signal events that happened in the failing test; correlating the signal events to coverage bins to generate a sequence of coverage bins; creating cross coverage event sequence bins based on the sequence of coverage bins; and outputting the created coverage event sequence bins for testing the device.

REFERENCES:
patent: 5202889 (1993-04-01), Aharon et al.
patent: 6212667 (2001-04-01), Geer et al.
patent: 6334199 (2001-12-01), Ono et al.
patent: 6742166 (2004-05-01), Foster et al.
patent: 7007251 (2006-02-01), Hekmatpour
patent: 7089474 (2006-08-01), Burdine et al.
patent: 7225377 (2007-05-01), Ishida et al.
patent: 7254764 (2007-08-01), Ishida et al.
patent: 7278056 (2007-10-01), Hekmatpour
patent: 7299447 (2007-11-01), Spirkl
patent: 2001/0010091 (2001-07-01), Noy
patent: 2003/0018945 (2003-01-01), Foster et al.
patent: 2003/0121011 (2003-06-01), Carter
patent: 2005/0102596 (2005-05-01), Hekmatpour
patent: 2006/0107141 (2006-05-01), Hekmatpour

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