Thin film testing method

Details Thin film testing method Thin film testing method

1989-04-21

1991-12-24

Nguyen, Nam X.

Chemistry: electrical and wave energy

Processes and products

Coating, forming or etching by sputtering

20419216, 73 7, 73150R, C23C 1434, G01N 356

Patent

active

050749838

ABSTRACT:
A method of evaluating the start/stop lifetime of a thin-film magnetic medium having an overcoat formed by sputtering a carbon-containing overcoat on a magnetic-film substrate. Resistance to erosion of the medium is evaluated by the time required to wear away the overcoat during a high-speed abrasion treatment. Lubricity is measured either in terms of the coefficient of friction of the disc, or in terms or surface hydrophobicity, as gauged by one of a number of measurable surface properties. The method allows for rapid assessment of disc wear properties, and can be used to optimize sputtering conditions required to achieve selected hardness and lubricity properties in a disc overcoat.

REFERENCES:
patent: 4737419 (1988-04-01), Hilden et al.
patent: 4774130 (1988-09-01), Endo et al.
patent: 4778582 (1988-10-01), Howard
patent: 4869797 (1989-09-01), Nagao et al.
patent: 4898774 (1990-02-01), Yamashita et al.

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