Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-08-30
2010-10-19
Pham, Thanh V (Department: 2894)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S270000, C438S272000, C438S259000, C438S589000, C257SE29260, C257SE29257, C257SE29262, C257S331000, C257S332000
Reexamination Certificate
active
07816210
ABSTRACT:
A method is disclosed for producing a trench transistor which has at least two trenches with in each case a field electrode arranged therein and a gate electrode arranged therein. In the method, it is provided to implement the trenches with different trench widths and then to produce the field electrodes by filling up the trenches with an electrode material and subsequent cutting back of the electrode material. The different trench width leads to different etching rates during the cutting back of the electrode material, and thus to field electrodes which are spaced apart from a top edge of the trenches by different amounts. Following this, the gate electrodes are produced which, due to the different dimensions of the field electrodes, extend into the trenches to a different depth, resulting in different gate capacitances for the gate electrodes in the two trenches.
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Hirler Franz
Poelzl Martin
Infineon - Technologies AG
Ligai Maria
Maginot Moore & Beck
Pham Thanh V
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