Device and method for JTAG test

Details Device and method for JTAG test Device and method for JTAG test

2005-07-06

2009-11-03

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C365S201000, C714S724000, C716S030000, C702S117000

Reexamination Certificate

active

07613968

ABSTRACT:
In order to realize a JTAG test of a printed board including a semiconductor device having JTAG test unsupported input/output terminals inside thereof, one device is logically divided into two devices such as a JTAG test supported device and a JTAG test unsupported device, boundary scan FFs are inserted between the two devices to be combined with another device configured in the same way and the JTAG test unsupported parts of both devices are equivalently combined to be regarded as one JTAG test unsupported device. Then, this device is sandwiched by the JTAG test supported devices and a JTAG test is conducted.

REFERENCES:
patent: 5764076 (1998-06-01), Lee et al.
patent: 5898776 (1999-04-01), Apland et al.
patent: 5926201 (1999-07-01), Fleming et al.
patent: 6122762 (2000-09-01), Kim
patent: 6145100 (2000-11-01), Madduri
patent: 6212628 (2001-04-01), Abercrombie et al.
patent: 6246614 (2001-06-01), Ooishi
patent: 6266793 (2001-07-01), Mozdzen et al.
patent: 6499125 (2002-12-01), Ohta et al.
patent: 6539511 (2003-03-01), Hashizume
patent: 6653957 (2003-11-01), Patterson et al.
patent: 6658632 (2003-12-01), Parulkar et al.
patent: 6862705 (2005-03-01), Nesbitt et al.
patent: 6937493 (2005-08-01), Krause et al.
patent: 6983441 (2006-01-01), Wescott
patent: 6988230 (2006-01-01), Vermeulen et al.
patent: 6990618 (2006-01-01), Lulla et al.
patent: 7088091 (2006-08-01), Abdennadher
patent: 2003/0046015 (2003-03-01), Gotoh et al.
patent: 2003/0093730 (2003-05-01), Halder et al.
patent: 2003/0163773 (2003-08-01), O'Brien et al.
patent: 2003/0188243 (2003-10-01), Rajan
patent: 2003/0229835 (2003-12-01), Whetsel
patent: 2004/0001432 (2004-01-01), Wescott
patent: 2005/0138503 (2005-06-01), Whetsel
patent: 11-218560 (1999-08-01), None
patent: 11-271400 (1999-10-01), None
patent: 2000-0045795 (2000-07-01), None
patent: 2002-373086 (2002-12-01), None
patent: 2003-78020 (2003-03-01), None
patent: 2003-344508 (2003-12-01), None
patent: 2004-069650 (2004-03-01), None
patent: 2004-135337 (2004-04-01), None
patent: 2005-503563 (2005-02-01), None
patent: 20010048756 (2001-06-01), None
patent: 20040057495 (2004-07-01), None
patent: 311176 (1997-07-01), None
patent: 484016 (2002-04-01), None
patent: 229741 (2005-03-01), None
patent: WO 02/057921 (2002-07-01), None
Kazumi Sakamaki, “JTAG test-Basics and Applications”, Mar. 15, 2003, pp. 53-54, CQ Publishing Company.

Affiliated with

Also associated with

Rating

Device and method for JTAG test does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Device and method for JTAG test, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device and method for JTAG test will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4136296