Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-02-03
2009-12-29
Ellis, Kevin L (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C365S201000, C324S765010
Reexamination Certificate
active
07640469
ABSTRACT:
An electronic element, test system and method of testing an electronic circuit are provided. The electronic circuit has input and output terminals. The input terminals receive a test signal sequence to test the electronic circuit. Actual value signals of a 3-value logic of the electronic circuit are provided at the output terminals in response to the test signal sequence. A comparator circuit has first and second input terminals and an output terminal. Each of the output terminals of the electronic circuit are coupled to a first input terminal. The second input terminals receive desired value signals. The comparator circuit compares the actual value signals with the desired value signals and provides the comparison to the output terminal of the comparator circuit.
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Arnold Ralf
Ossimitz Peter
Brinks Hofer Gilson & Lione
Ellis Kevin L
Infineon - Technologies AG
Merant Guerrier
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