Test data reporting and analyzing using data array and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Details

C714S723000, C714S733000, C714S057000, C714S031000, C714S025000, C714S718000, C714S048000, C714S046000, C324S765010, C324S528000, C324S759030, C324S763010, C324S764010

Reexamination Certificate

active

07543198

ABSTRACT:
Reporting and/or analyzing test data from a plurality of tests of an array structure using a data array. One method includes obtaining the test data, and reporting the test data in a data array, which includes at least two portions representing different tests. Data stored in the data array is organized according to a translation table, which describes the locations of data for tests and criteria for data to be analyzed within the data array. Numerous other data arrangements such as a coordinate file listing a pre-defined maximum number of fail points, or a chip report including fail points by chip may also be generated. The data array reports all test data in a more easily generated and stored form, and may be converted to an image. A data analysis method for analyzing data using the data array is also presented.

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patent: 2005/0022065 (2005-01-01), Dixon et al.
patent: 2005/0039073 (2005-02-01), Hartmann
patent: 1342318 (2002-03-01), None

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