Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-02-22
2009-11-24
Prenty, Mark (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S324000, C438S257000
Reexamination Certificate
active
07622765
ABSTRACT:
A non-volatile memory device and a method of fabricating the same are provided. A non-volatile memory device may include a semiconductor substrate including a body and at least one pair of fins vertically protruding from the body and spaced apart from each other, and at least one control gate electrode on at least portions of outer side surfaces of the at least one pair of fins and extending onto top portions of the at least one pair of fins on an angle with the at least one pair of fins. The non-volatile memory device may further include at least one pair of gate insulating layers between the at least one control gate electrode and the at least one pair of fins, and at least one pair of storage node layers between the at least one pair of gate insulating layers and at least a portion of the at least one control gate electrode. The at least one control gate electrode may extend onto top portions of the at least one pair of fins in a zigzag fashion.
REFERENCES:
patent: 6664582 (2003-12-01), Fried et al.
patent: 6876042 (2005-04-01), Yu et al.
patent: 7224019 (2007-05-01), Hieda et al.
Kim Won-joo
Lee Jung-hoon
Park Yoon-dong
Harness & Dickey & Pierce P.L.C.
Prenty Mark
Samsung Electronics Co,. Ltd.
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