Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Patent
1997-08-28
1999-06-15
Niebling, John F.
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
438648, 438649, 438653, 438655, 438656, 438660, 438663, 438664, 438680, 438682, 438683, 438927, H01L 214763
Patent
active
059131454
ABSTRACT:
In order to provide a thermally stable diffusion barrier for a contact, a layer of titanium is formed on the patterned substrate. A layer of tungsten nitride is formed on the titanium layer. After an annealing step, an interfacial layer and a layer of titanium nitride are formed between the substrate and a tungsten layer. These layers provide a diffusion barrier which is more thermally stable than a titanium nitride layer applied directly on the substrate and permits the formation of a contact structures that can withstand subsequent high temperature steps.
REFERENCES:
patent: 4816424 (1989-03-01), Watanabe et al.
patent: 5047367 (1991-09-01), Wei et al.
patent: 5567652 (1996-10-01), Nishio
patent: 5710070 (1998-01-01), Chan
Cho Chih-Chen
Lu Jiong-Ping
Brady Wade James
Donaldson Richard L.
Garner Jacqueline J.
Niebling John F.
Texas Instruments Incorporated
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