Method of manufacturing a ferroelectric semiconductor device...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C257S306000

Reexamination Certificate

active

07601585

ABSTRACT:
In pattern-forming ferroelectric capacitor structures by a one mask etching, after an Ir film to be a lower electrode film is formed, an AlOxfilm to be an oxide reduction film reducing an Ir oxide which is formed on a surface layer of the lower electric film is deposited on the lower electrode film, and then this oxide reduction film is removed by, for example, a dilute hydrofluoric acid treatment.

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patent: 5851896 (1998-12-01), Summerfelt
patent: 6358855 (2002-03-01), Ramachandran et al.
patent: 6479304 (2002-11-01), Zhang et al.
patent: 7371589 (2008-05-01), Kweon
patent: 2004/0113189 (2004-06-01), Takamatsu et al.
patent: 8-64786 (1996-03-01), None
D. Lide, CRC Handbook of Chemistry and Physics, 2007, CRC Press/Taylor & Francis, 88th Edition, pp. 10.202-10.204.

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