Semiconductor device and method of forming wires of...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C257SE23145

Reexamination Certificate

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07638423

ABSTRACT:
A method of forming wires of a semiconductor device including forming a first metal wire on a semiconductor substrate; forming a first insulating film on the first metal wire; etching a portion of the first insulating film to expose a surface portion of the first metal wire; forming a first barrier metal film on sidewalls of the opening and the exposed first metal wire; etching a portion of the first barrier metal film on the first metal wire to expose a surface portion of the first metal wire; performing a heat treatment process on the exposed surface portion of the first metal wire to improve surface roughness; and forming a second wire by filling the opening using a conductive material.

REFERENCES:
patent: 5966634 (1999-10-01), Inohara et al.
patent: 6380075 (2002-04-01), Cabral et al.
patent: 7049226 (2006-05-01), Chung et al.
patent: 7262133 (2007-08-01), Chen et al.
patent: 7332428 (2008-02-01), Beck
patent: 2004-356500 (2004-12-01), None
patent: 1020030002137 (2003-01-01), None
patent: 1020050040552 (2005-05-01), None

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