Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-10-05
2009-06-23
Luu, Chuong Anh (Department: 2892)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S197000, C438S312000, C438S232000
Reexamination Certificate
active
07550351
ABSTRACT:
The invention is directed to an improved transistor that reduces dopant cross-diffusion and improves chip density. A first embodiment of the invention comprises gate electrode material partially removed at a junction of a first gate electrode region comprised of gate material doped with first ions for a first device and second gate electrode region comprised of gate material doped with second ions for a second device. The respectively doped regions are connected by a silicide layer near the top surface of the gate conductors.
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Chen Xiangdong
Yang Haining
International Business Machines - Corporation
Luu Chuong Anh
Schnurmann H. Daniel
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