Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-01-17
2009-06-16
Purvis, Sue (Department: 2891)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S322000, C257S320000, C257SE21209, C257SE21662
Reexamination Certificate
active
07547940
ABSTRACT:
Non-volatile memory devices according to embodiments of the present invention include an EEPROM transistor in a first portion of a semiconductor substrate, an access transistor in a second portion of the semiconductor substrate and an erase transistor in a third portion of the semiconductor substrate. The second portion of the semiconductor substrate extends adjacent a first side of the first portion of the semiconductor substrate and the third portion of the semiconductor substrate extends adjacent a second side of the first portion of the semiconductor substrate. The first and second sides of the first portion of the semiconductor substrate may be opposite sides of the first portion of the semiconductor substrate. The access transistor has a first source/drain terminal electrically connected to a first source/drain terminal of the EEPROM transistor and the erase transistor has a first source/drain terminal electrically connected to a second source/drain terminal of the access transistor.
REFERENCES:
patent: 2007/0148851 (2007-06-01), Kim et al.
patent: 06-338617 (1994-12-01), None
patent: 07-245352 (1995-09-01), None
patent: 1020000039304 (2000-07-01), None
Myers Bigel & Sibley & Sajovec
Purvis Sue
Samsung Electronics Co,. Ltd.
Wright Tucker
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