Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Reexamination Certificate
2008-01-02
2009-11-17
Chu, John S (Department: 1795)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
C430S326000, C430S330000, C430S910000, C430S921000, C430S922000
Reexamination Certificate
active
07618765
ABSTRACT:
A positive resist composition comprises (A) a resin component which becomes soluble in an alkaline developer under the action of an acid, and (B) an acid generator which is a specific sulfonium salt compound. The resin (A) is a polymer comprising tertiary alkyl protective group units having a hydrophobic tetracyclo[4.4.0.12,5.17,10]dodecane structure, di- or trihydroxyadamantyl units, and monocyclic lactone units.
REFERENCES:
patent: 5714625 (1998-02-01), Hada et al.
patent: 6063953 (2000-05-01), Hada et al.
patent: 6200725 (2001-03-01), Takechi et al.
patent: 6312867 (2001-11-01), Kinsho et al.
patent: 6329125 (2001-12-01), Takechi et al.
patent: 6916591 (2005-07-01), Ohsawa et al.
patent: 2005/0031988 (2005-02-01), Watanabe et al.
patent: 2006/0246377 (2006-11-01), Yamato et al.
patent: 2009/0011365 (2009-01-01), Kobayashi et al.
patent: 9-73173 (1997-03-01), None
patent: 9-90637 (1997-04-01), None
patent: 9-95479 (1997-04-01), None
patent: 9-230588 (1997-09-01), None
patent: 2906999 (1999-04-01), None
patent: 2000-336121 (2000-12-01), None
patent: 2005-54070 (2005-03-01), None
patent: WO 2004/074242 (2004-09-01), None
Koji Arimitsu et al., “Sensitivity Enhancement of Chemical-Amplification-Type Photoimaging Materials by Acetoacetic Acid Derivatives,” Journal of Photopolymer Science and Technology, vol. 8, No. 1, 01995, pp. 43-44.
Kazuaki Kudo et al., “Enhancement of the Senesitivity of Chemical-Amplification-Type Photoimaging Materials by β-Tosyloxyketone Acetals,” Journal of Photopolymer Science and Technology, vol. 8, No. 1, 1995, pp. 45-46.
Koji Arimitsu et al., “Effect of Phenolic Hydroxyl Residues on the Improvement of Acid-Proliferation-Type Photoimaging Materials,” Journal of Photopolymer Science and Technology, vol. 9, No. 1, 1996, pp. 29-30.
Kobayashi Katsuhiro
Nishi Tsunehiro
Tachibana Seiichiro
Birch & Stewart Kolasch & Birch, LLP
Chu John S
Shin-Etsu Chemical Co. , Ltd.
LandOfFree
Positive resist composition and patterning process does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Positive resist composition and patterning process, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Positive resist composition and patterning process will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4054222