Semiconductor memory device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S297000, C257S298000, C257S299000, C257S310000, C257S311000, C257S312000, C257S313000, C257S314000, C257S315000, C257S316000

Reexamination Certificate

active

07459741

ABSTRACT:
A semiconductor memory device excellent in data holding characteristics even when a cell area is reduced is disclosed. According to one aspect of the present invention, a semiconductor memory device comprises a transistor including a source, a drain and a channel region disposed in a semiconductor substrate, and including a gate electrode disposed through a gate insulator on a surface of the semiconductor substrate of the channel region, a capacitor connected to the channel region, a first wiring line electrically connected to the gate electrode, and a second wiring line electrically connected to the drain.

REFERENCES:
patent: 5942778 (1999-08-01), Oikawa
patent: 6700150 (2004-03-01), Wu
patent: 6759702 (2004-07-01), Radens et al.
patent: 2004/0061161 (2004-04-01), Radens et al.
patent: 2005/0141262 (2005-06-01), Yamada et al.
patent: 2005/0196932 (2005-09-01), Divakaruni et al.
patent: 2002-26147 (2002-01-01), None
patent: 2004-335031 (2004-11-01), None

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