Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-03-28
2008-12-02
Nguyen, Cuong Q (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S297000, C257S298000, C257S299000, C257S310000, C257S311000, C257S312000, C257S313000, C257S314000, C257S315000, C257S316000
Reexamination Certificate
active
07459741
ABSTRACT:
A semiconductor memory device excellent in data holding characteristics even when a cell area is reduced is disclosed. According to one aspect of the present invention, a semiconductor memory device comprises a transistor including a source, a drain and a channel region disposed in a semiconductor substrate, and including a gate electrode disposed through a gate insulator on a surface of the semiconductor substrate of the channel region, a capacitor connected to the channel region, a first wiring line electrically connected to the gate electrode, and a second wiring line electrically connected to the drain.
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Aochi Hideaki
Katsumata Ryota
Kidoh Masaru
Kito Masaru
Kabushiki Kaisha Toshiba
Nguyen Cuong Q
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Tran Trang Q
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