Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2006-01-23
2008-10-14
Norton, Nadine (Department: 1792)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S689000, C438S702000, C134S001100, C134S022100, C216S067000, C216S071000, C156S345480
Reexamination Certificate
active
07435687
ABSTRACT:
The invention provides a plasma processing method and plasma processing device for manufacturing semiconductor devices in which the number of foreign particles being adhered to the wafer is reduced greatly and the yield is improved. In a plasma processing device having a plasma source capable of controlling plasma distribution, the shape of a sheath/bulk boundary above the wafer is controlled to a convexed shape when the plasma is turned on and off. By adding a step of applying a low source power and wafer bias power when the plasma is turned on and off in order to realize an out-high plasma distribution, it is possible to form a sheath that is thicker near the center of the wafer and thinner at the outer circumference portion thereof.
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Kanekiyo Tadamitsu
Kobayashi Hiroyuki
Maeda Kenji
Tamura Tomoyuki
Yokogawa Ken'etsu
Angadi Maki
Antonelli, Terry Stout & Kraus, LLP.
Hitachi High-Technologies Corporation
Norton Nadine
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