Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2006-01-09
2008-08-12
Malsawma, Lex (Department: 2892)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C257SE21577
Reexamination Certificate
active
07410896
ABSTRACT:
A low-k dielectric film is formed on an entire surface of a substrate having a pad region and a circuit region. A resist pattern is formed on the low-k dielectric film, and an opening is formed in the low-k dielectric film of the pad region using the resist pattern as a mask. A silicon oxide film having strength higher than the low-k dielectric film is formed in the opening using liquid-phase deposition method. Wirings are formed in the silicon oxide film of the pad region and in the low-k dielectric film of the circuit region using damascene method.
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Malsawma Lex
Marger & Johnson & McCollom, P.C.
Samsung Electronics Co,. Ltd.
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