Semiconductor device and a method of manufacturing the same

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S279000

Reexamination Certificate

active

07348245

ABSTRACT:
Manufacturing method of a semiconductor device for forming a rewritable nonvolatile memory cell including a first field effect transistor for memory, a circuit including a second field effect transistor and a circuit including a third field effect transistor, including forming a gate insulating film over a semiconductor substrate, a gate electrode over the gate insulating film and sidewall spacers over the sidewalls of the gate electrode associated with each of the first through third field effect transistors. The sidewall spacers of at least the first field effect transistor have a different width than that of at least the second field effect transistor, the gate electrode of the third field effect transistor has a different length than that of at least the first field effect transistor for memory and the gate insulating film of the third field effect transistor has a thickness larger than that of the second field effect transistor.

REFERENCES:
patent: 5329482 (1994-07-01), Nakajima et al.
patent: 2004/0152262 (2004-08-01), Ichige et al.
patent: 5-102428 (1993-04-01), None
patent: 6-181293 (1994-06-01), None
patent: 7-176729 (1995-07-01), None

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