Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2008-04-22
2008-04-22
Chung, Phung M. (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S718000, 36, 36
Reexamination Certificate
active
10937607
ABSTRACT:
A semiconductor device, according to the present invention, includes an external input terminal to which first and second input test signals are supplied; a memory circuit, in which a test operation is performed in accordance with the first input test signal to provide a first test result signal; a logic circuit, in which a test operation is performed in accordance with the second input test signal to provide a second test result signal; an external output terminal from which the first and second test result signals are outputted selectively; and a switch circuit which selectively couples the memory circuit and the logic circuit to the external input terminal and the external output terminal.
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Chung Phung M.
Oki Electric Industry Co. Ltd.
Rabin & Berdo P.C.
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