Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2008-03-18
2008-03-18
Pham, Long (Department: 2814)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S257000
Reexamination Certificate
active
11447909
ABSTRACT:
A memory device including at least one first memory element comprising a first layer of amorphous carbon over at least one second memory element comprising a second layer of amorphous carbon. The device also includes at least one first conductive layer common to the at least one first and the at least one second memory elements.
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E. G. Gerstner et al.—“Nonvolatile memory effects in nitrogen doped tetrahedral amorphous carbon thin films,” Journal of Applied Physics, vol. 84, No. 10, Nov. 15, 1998, pp. 5647-5651.
Brooks Joseph F.
Campbell Kristy A.
Moore John
Dickstein & Shapiro LLP
Micro)n Technology, Inc.
Pham Long
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