Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate
2008-03-04
2008-03-04
Punnoose, Roy M. (Department: 2886)
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
C250S206000, C250S208100
Reexamination Certificate
active
11031181
ABSTRACT:
A solid-state image pickup device has a photoelectric conversion part performing photoelectric conversion on incident light, a comparison part connected to an output terminal of the photoelectric conversion part to compare an output voltage of the photoelectric conversion part with a reference voltage, a capacitive element having one end connected to the output terminal of the photoelectric conversion part, and a control line connected to the other end of the capacitive element. In a signal storage period, a first control voltage is applied to the control line so as to make an electric potential at the output terminal of the photoelectric conversion part fall outside a transition region of the comparator. In a signal read period, a second control voltage is applied to the control line so as to make the electric potential at the output terminal of the photoelectric conversion part fall within the transition region of the comparator.
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Hashiguchi Kazuo
Shoho Makoto
Conlin David C.
Edwards Angell Palmer & & Dodge LLP
Jensen Steven M.
Punnoose Roy M.
Sharp Kabushiki Kaisha
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