Fabrication method for a semiconductor structure having...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S244000, C438S386000, C438S387000, C257SE29346

Reexamination Certificate

active

11127505

ABSTRACT:
The present invention provides a fabrication method for a semiconductor structure having integrated capacitors and a corresponding semiconductor structure. The fabrication method has the following steps of: providing a semiconductor substrate (1; 1′, 60, 1″) having a front side (VS) and a rear side (RS); providing trenches (5) in the semiconductor substrate (1; 1′, 60, 1″) proceeding from the front side (VS) of the semiconductor substrate (1; 1′, 60, 1″); providing a respective inner capacitor electrode (6) in the trenches (5); uncovering the inner capacitor electrodes (6) proceeding from the rear side (RS) of the semiconductor substrate (1; 1′, 60, 1″); providing a capacitor dielectric (40) on the uncovered inner capacitor electrodes (6); and providing outer capacitor electrodes (50) on the capacitor dielectric (40) on the inner capacitor electrodes (6).

REFERENCES:
patent: 5521115 (1996-05-01), Park et al.
patent: 6603164 (2003-08-01), Kastner et al.
patent: 6724030 (2004-04-01), Hummler
patent: 7223697 (2007-05-01), Brooks et al.
patent: 2002/0137278 (2002-09-01), Temmler et al.
patent: 2004/0245558 (2004-12-01), Manger
patent: 10065664 (2002-07-01), None
patent: 10301936 (2003-09-01), None
patent: 62072171 (1987-04-01), None
German Office Action dated Jan. 13, 2005.

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