System and method for testing electronic devices on a microchip

Details System and method for testing electronic devices on a microchip System and method for testing electronic devices on a microchip

2007-08-21

2007-08-21

Chung, Phung My (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S724000, C714S726000, C714S733000

Reexamination Certificate

active

10721646

ABSTRACT:
A system and method for testing first and second sets of electronic devices on a microchip is provided. The first set of devices receive input data and then send output data to a first multiple input shift register (MISR). The second set of devices receiving input data and then sending output data to a second MISR. The method includes determining a first seed signature value associated with the first MISR that induces the first MISR to have a first final signature value comprising a plurality of identical binary values when the first set of devices send valid output data to the first MISR when receiving a first predetermined sequence of input data.

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