Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-11-20
2007-11-20
Smith, Matthew (Department: 2823)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S619000, C438S421000, C438S422000, C257SE21564, C257SE23013
Reexamination Certificate
active
11434414
ABSTRACT:
A method of forming a floating gate of a flash memory device wherein a hard mask nitride film is stripped using two or more etching steps. Accordingly, a seam can be prevented when depositing a floating gate polysilicon film. Furthermore, the floating gate polysilicon film may be blanket-etched to make rounded upper edge portions of the floating gate polysilicon film. In this way, a void can be prevented when depositing a control gate polysilicon.
REFERENCES:
patent: 6838342 (2005-01-01), Ding
patent: 2003/0082876 (2003-05-01), Mandelman et al.
Hynix / Semiconductor Inc.
Marshall & Gerstein & Borun LLP
Singal Ankush K
Smith Matthew
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