Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-01-16
2007-01-16
Dang, Trung (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257SE21409
Reexamination Certificate
active
11062723
ABSTRACT:
A semiconductor device having a hybrid-strained layer and a method of forming the same are discussed. The semiconductor device comprises: a gate dielectric over a substrate; a gate electrode over the gate dielectric; an optional pair of spacers along the sidewalls of the gate dielectric and the gate electrode; a source/drain region substantially aligned with an edge of the gate electrode; and a strained layer over the source/drain region, gate electrode, and spacers wherein the strained layer has a first portion and a second portion. The first portion of the strained layer is substantially over the source/drain region and has a first inherent strain. The second portion of the strained layer has at least a portion substantially over the gate electrode and the spacers and has a second inherent strain of the opposite type of the first strain.
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Chen Chien-Hao
Lee Tze-Liang
Dang Trung
Slater & Matsil L.L.P.
Taiwan Semiconductor Manufacturing Company , Ltd.
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