Test apparatus and test method

Details Test apparatus and test method Test apparatus and test method

2007-05-01

2007-05-01

Tu, Christine T. (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S047300

Reexamination Certificate

active

11039394

ABSTRACT:
A test apparatus includes: an instruction execution unit for sequentially executing instructions in a test program for a DUT in each instruction cycle; a default pattern memory for storing default pattern sequence to be associated with default pattern identification information for identifying that default pattern sequence; a test pattern memory for storing test pattern sequence output in an instruction cycle period for executing that instruction or the default pattern identification information that is output in the instruction cycle period; a test pattern memory read unit for reading the test pattern sequence or the default pattern identification information that is stored and is associated with that instruction in the test pattern memory; a default pattern read unit for reading the default pattern sequence that is stored and is associated with the default pattern identification information in the default pattern memory; and a test pattern output unit.

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