Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-03-20
2007-03-20
Trinh, Michael (Department: 2822)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S301000, C438S306000
Reexamination Certificate
active
10765027
ABSTRACT:
Example methods of manufacturing MOSFET devices are disclosed. One example method may include an oxidation, an etching, an ion implanting for a threshold voltage control to form an elevated source/drain region and thereby implements an ultra shallow junction.
REFERENCES:
patent: 4830975 (1989-05-01), Bovaird et al.
patent: 5583064 (1996-12-01), Lee et al.
patent: 5817558 (1998-10-01), Wu
patent: 6054355 (2000-04-01), Inumiya et al.
patent: 6127699 (2000-10-01), Ni et al.
patent: 6309933 (2001-10-01), Li et al.
patent: 6465842 (2002-10-01), Nishinohara
patent: 6642130 (2003-11-01), Park
Dongbu Electronics Co. Ltd.
Fortney Andrew D.
Trinh Michael
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