Source/drain extensions having highly activated and...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S299000, C438S483000, C438S488000, C438S492000, C438S586000, C257SE21634

Reexamination Certificate

active

10955270

ABSTRACT:
A method for making a transistor within a semiconductor wafer. The method may include etching a recess at source/drain extension locations90and depositing SiGe within the recess to form SiGe source/drain extensions90. Dopants are implanted into the SiGe source/drain extensions90and the semiconductor wafer10is annealed. Also, a transistor source/drain region80, 90having a SiGe source/drain extension90that contains evenly distributed dopants, is highly doped, and has highly abrupt edges.

REFERENCES:
patent: 6060392 (2000-05-01), Essaian et al.
patent: 6063677 (2000-05-01), Rodder et al.
patent: 6156654 (2000-12-01), Ho et al.
patent: 6509241 (2003-01-01), Park et al.
patent: 6624477 (2003-09-01), Takemura et al.
patent: 6673665 (2004-01-01), Wieczorek et al.
patent: 6812106 (2004-11-01), Xiang et al.
patent: 6872626 (2005-03-01), Cheng
patent: 2003/0211684 (2003-11-01), Guo

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