Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-07-24
2007-07-24
Fourson, George R. (Department: 2823)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S299000, C438S483000, C438S488000, C438S492000, C438S586000, C257SE21634
Reexamination Certificate
active
10955270
ABSTRACT:
A method for making a transistor within a semiconductor wafer. The method may include etching a recess at source/drain extension locations90and depositing SiGe within the recess to form SiGe source/drain extensions90. Dopants are implanted into the SiGe source/drain extensions90and the semiconductor wafer10is annealed. Also, a transistor source/drain region80, 90having a SiGe source/drain extension90that contains evenly distributed dopants, is highly doped, and has highly abrupt edges.
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Brady W. James
Fourson George R.
Keagy Rose Alyssa
Maldonado Julio J.
Telecky , Jr. Frederick J.
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