Semiconductor sensor device using MEMS technology

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S113000, C438S460000, C257SE21008, C257S019000, C257S421000

Reexamination Certificate

active

10894528

ABSTRACT:
A semiconductor sensor device is formed using MEMS technology by placing a thin layer of single-crystal silicon, which includes semiconductor devices, over a cavity, which has been formed in a semiconductor material. The thin layer of single-crystal silicon can be formed by forming the semiconductor devices in the top surface of a single-crystal silicon wafer, thinning the silicon wafer to a desired thickness, and then dicing the thinned wafer to form silicon layers of a desired size. The MEMS device can be used to implement a pressure sensor, microphone, temperature sensor, and a joystick.

REFERENCES:
patent: 4790192 (1988-12-01), Knecht et al.
patent: 5702619 (1997-12-01), Kurtz et al.
patent: 6279402 (2001-08-01), Fisher
patent: 6378378 (2002-04-01), Fisher
Karl Behringer, University of Washington, “EE 539 Tm/M(S)E 599 Tm, Lecture B2, Micro/Nano/MEMS”, Spring 2003, [online], [retrieved on Jun. 28, 2004]. Retrieved from the Internet: <URL:http://courses.washington.edu/mengr599/tm—taya
otes/b2.pdf>, pp. 1-10 (unnumbered).

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