Method of recording information in nonvolatile semiconductor...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S278000, C438S910000, C257S317000, C257S391000, C365S185140, C365S185260, C365S185150

Reexamination Certificate

active

11060297

ABSTRACT:
A nonvolatile semiconductor memory includes a transistor, one or two resistance-change portions, and one or two charge accumulation portions. The transistor has a control electrode, first main electrode region, and second main electrode region. Each resistance-change portion is of a second conductivity type having impurity concentration lower than that of the first and second main electrode regions. The charge-accumulation portions are provided on the associated resistance-change portions. Each charge accumulation portion has an insulating layer, and is capable of accumulating charge.

REFERENCES:
patent: 4173766 (1979-11-01), Hayes
patent: 4173791 (1979-11-01), Bell
patent: 5408115 (1995-04-01), Chang
patent: 6255166 (2001-07-01), Ogura et al.
patent: 6335554 (2002-01-01), Yoshikawa
patent: 6670240 (2003-12-01), Ogura et al.
patent: 7038282 (2006-05-01), Tokui et al.
patent: 7050331 (2006-05-01), Matsuoka et al.
patent: 7064982 (2006-06-01), Yaoi et al.
patent: 2004/0233714 (2004-11-01), Morikawa et al.
patent: 2004/0256653 (2004-12-01), Iwata et al.
patent: 09-252059 (1997-09-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of recording information in nonvolatile semiconductor... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of recording information in nonvolatile semiconductor..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of recording information in nonvolatile semiconductor... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3760738

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.