Clock duty cycle based access timer combined with standard...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C714S724000, C714S744000

Reexamination Certificate

active

11057318

ABSTRACT:
An output of an element under test is captured and stored, through a multiplexer, in a capture register. At a clock edge (either rising or falling edge) the element under test catches the “edge” and “strobes” the output. The multiplexer is strobed, and the delay and duty cycle are measured. Both the rising and falling edge are used as the timer.

REFERENCES:
patent: 2003/0196150 (2003-10-01), Linam et al.
IBM, Integer Divisible Frequency Divider with Symmetric Outputs, May 1, 1996, IBM Technical Disclosure Bulletin, May 1996 vol. 39, pp. 187-188.
IBM, Test Bus Architecture, Aug. 1, 1989, IBM Technical Disclosure Bulletin, Aug. 1989, vol. 32, pp. 21-27.

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