Semiconductor device and method of manufacturing the...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C438S283000, C438S264000, C438S217000, C257SE21433

Reexamination Certificate

active

11024252

ABSTRACT:
In a method of manufacturing a semiconductor device to improve structural stability of a semiconductor device in a silicidation process, a substrate is provided to have an active region defined by an isolation layer. An etching mask is formed on the active region and the isolation layer to have a silicidation prevention pattern that at least partially exposes the active region. A gate structure is formed on the exposed active region. A gate spacer is formed on a sidewall of the gate structure positioned on the silicidation prevention pattern. Source/drain regions are formed on the active region using the gate spacer as a mask to thereby form the semiconductor device. Since voids may not be generated in a transistor of the semiconductor device or intrusion of the transistor may be prevented in the silicidation process, the semiconductor device including the transistor may have improved reliability and electrical characteristics.

REFERENCES:
patent: 5627097 (1997-05-01), Venkatesan et al.
patent: 6018179 (2000-01-01), Gardner et al.
patent: 6136655 (2000-10-01), Assaderaghi et al.
patent: 6410938 (2002-06-01), Xiang
patent: 6413857 (2002-07-01), Subramanian et al.
patent: 6518130 (2003-02-01), Ohno
patent: 6586808 (2003-07-01), Xiang et al.
patent: 2001-102545 (2001-04-01), None
patent: 01-8524 (2001-02-01), None
patent: 10-0308652 (2001-02-01), None
patent: 01-39946 (2001-05-01), None
patent: 02-2635 (2002-01-01), None

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