Semiconductor device and method of manufacturing the same

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C257SE29187, C257SE21609, C257S342000, C438S269000

Reexamination Certificate

active

10403122

ABSTRACT:
A semiconductor device comprises a drain layer of first conductivity type, drift layers of first and second conductivity types on the drain layer, an insulating film between the drift layers and contacting the drift layers, a first base layer of second conductivity type on a surface of the drift layer of first conductivity type, a source layer of first conductivity type selectively provided on a surface of the first base layer of second conductivity type, a gate insulating film on the first base layer of second conductivity type between the source layer and the drift layer, a gate electrode on the gate insulating film, a second base layer of second conductivity type on a surface of the drift layer, a first main electrode on the drain layer, and a second main electrode on the source layer, the first base layer and the second base layer.

REFERENCES:
patent: 5216275 (1993-06-01), Chen
patent: 5438215 (1995-08-01), Tihanyi
patent: 6201279 (2001-03-01), Pfirsch
patent: 6600194 (2003-07-01), Hueting et al.
patent: 6724042 (2004-04-01), Onishi et al.
patent: 2002/0167020 (2002-11-01), Iwamoto et al.
patent: 2003/0006453 (2003-01-01), Liang et al.
patent: 2004/0043565 (2004-03-01), Yamaguchi et al.
patent: 2001-135819 (2001-05-01), None
patent: 2001-298190 (2001-10-01), None
patent: 2001-298191 (2001-10-01), None
patent: 2002-134748 (2002-05-01), None
U.S. Appl. No. 11/453,997, filed Jun. 16, 2006, Saito et al.
U.S. Appl. No. 10/163,651, filed Jun. 7, 2002, Saitoh et al.
U.S. Appl. No. 10/327,937, filed Dec. 26, 2002, Okumura et al.
U.S. Appl. No. 10/388,498, filed Mar. 17, 2003, Yamaguchi et al.
U.S. Appl. No. 10/403,122, filed Apr. 1, 2003, Yamaguchi et al.

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