Semiconductor integrated circuit with test device

Details Semiconductor integrated circuit with test device Semiconductor integrated circuit with test device

1998-02-26

2000-03-07

Tu, Trinh L.

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

714731, G01R 3128

Patent

active

060354313

ABSTRACT:
A semiconductor integrated circuit (1) has a scan test circuit (6) and a target test circuit (4), connected to a CPU (3) and a RAM (2) through internal buses (5a and 5b) that are mounted on a same semiconductor chip. The scan test circuit (6) provides test signals to the target test circuit (4) having a plurality of flip flops connected one another in a line like a string of beads as a shift register.

REFERENCES:
patent: 5394403 (1995-02-01), Klein
patent: 5416409 (1995-05-01), Hunter
patent: 5544174 (1996-08-01), Abend
patent: 5708773 (1998-01-01), Jeppesen, III et al.

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