Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-09-18
2007-09-18
Vu, David (Department: 2818)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S222000
Reexamination Certificate
active
11086286
ABSTRACT:
Disclosed are a semiconductor devices and method of fabricating the same. Anti-etch films are formed in the top corners of the device isolation film using a material that has a different etch selectivity ratio from nitride or oxide and is not etched in an oxide gate pre-cleaning process. It is thus possible to prevent formation of a moat at the top corners of the device isolation film and the gate oxide film from being thinly formed, thereby improving reliability and electrical characteristics of the device.
REFERENCES:
patent: 6326281 (2001-12-01), Violette et al.
Cho Heung Jae
Lee Jung Ho
Lim Kwan Yong
Hynix / Semiconductor Inc.
Lowe Hauptman & Ham & Berner, LLP
Vu David
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