Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-08-29
2006-08-29
Brewster, William M. (Department: 2823)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S207000, C438S222000, C438S483000
Reexamination Certificate
active
07098095
ABSTRACT:
The vertical diffusion of dopants from the gate into the channel region, and the lateral diffusion of dopants from the source and drain regions into the channel region resulting from thermal cycling during the fabrication of a MOS transistor is minimized by forming the source and drain regions in a layer of silicon germanium carbon.
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Stanley Wolf, et al., “Silicon Processing For The VLSI Era”, vol. 1, Processing Technology, Lattice Press, 1986, pp. 155.
Naem Abdalla Aly
Yegnashankaran Visvamohan
Brewster William M.
Pickering Mark C.
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