Method of forming a MOS transistor with a layer of silicon...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S207000, C438S222000, C438S483000

Reexamination Certificate

active

07098095

ABSTRACT:
The vertical diffusion of dopants from the gate into the channel region, and the lateral diffusion of dopants from the source and drain regions into the channel region resulting from thermal cycling during the fabrication of a MOS transistor is minimized by forming the source and drain regions in a layer of silicon germanium carbon.

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patent: 2002/0179946 (2002-12-01), Hara, et al.
patent: 2002/0182423 (2002-12-01), Chu et al.
Stanley Wolf, et al., “Silicon Processing For The VLSI Era”, vol. 1, Processing Technology, Lattice Press, 1986, pp. 155.

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