Method and apparatus for isolating faulty semiconductor...

Details Method and apparatus for isolating faulty semiconductor... Method and apparatus for isolating faulty semiconductor...

2006-06-06

2006-06-06

Torres, Joseph D. (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S733000, C714S738000

Reexamination Certificate

active

07058870

ABSTRACT:
A method and an apparatus are provided for isolating faulty semiconductor devices in a multiple stream graphics system. The apparatus includes a buffer adapted to receive a plurality of data streams. The apparatus further includes a convolver comprising at least one convolution signature register; a router adapted to route the data streams from the buffer to the convolver, wherein the router comprises at least one router signature register; and an analyzer adapted to access the convolution and router signature registers, wherein the analyzer is capable of isolating at least one of a faulty semiconductor device and a faulty interconnection using the contents of the convolution and router signature registers.

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patent: 2003/0048276 (2003-03-01), Wasserman et al.
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patent: 2004/0015760 (2004-01-01), Naegle et al.
patent: 2004/0073858 (2004-04-01), Cheung
patent: 2004/0088638 (2004-05-01), Cheung

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