Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Reexamination Certificate
2006-11-14
2006-11-14
Wilczewski, Mary (Department: 2822)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
C438S240000, C438S758000, C438S786000
Reexamination Certificate
active
07135422
ABSTRACT:
Multi-layered structures formed using atomic-layer deposition processes include multiple metal oxide layers wherein the metal oxide layers are formed without the presence of interlayer oxide layers and may include different metal oxide compositions.
REFERENCES:
patent: 6420279 (2002-07-01), Ono et al.
patent: 2003/0040153 (2003-02-01), Kim et al.
patent: 2003/0234417 (2003-12-01), Raajimakers et al.
patent: 2004/0171280 (2004-09-01), Conley et al.
patent: 000013654 (2000-03-01), None
patent: 2001-0097641 (2001-11-01), None
Choi Han-Mei
Kim Ki-Chul
Kim Sung-Tae
Kim Young-Sun
Kwon Jong-Wan
Au Bac H.
Myers Bigel & Sibley Sajovec, PA
Samsung Electronics Co,. Ltd.
Wilczewski Mary
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